www.atmos-chem-phys.net/4/685/2004/ © Author(s) 2004. This work is licensed under a Creative Commons License. Aspect sensitivity of VHF echoes from field aligned irregularities in meteor trails and thin ionization layers 1Electrical and Computer Engineering Department, Miami University, Oxford, OH, USA 2CSSL, Pennsylvania State University, University Park, PA, USA 3Arecibo Observatory, Arecibo, Puerto Rico Abstract. The aspect sensitivity of VHF echoes from field aligned irregularities (FAI) within meteor trails and thin ionization layers is studied using numerical models. Although the maximum power is obtained when a radar is pointed perpendicular to the field line ( Final Revised Paper (PDF, 371 KB) Discussion Paper (ACPD) Citation: Zhou, Q. H., Morton, Y. T., Mathews, J. D., and Janches, D.: Aspect sensitivity of VHF echoes from field aligned irregularities in meteor trails and thin ionization layers, Atmos. Chem. Phys., 4, 685-692, 2004. Bibtex EndNote Reference Manager |
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